New Imaging Technologies (NIT) offers the SenS 1920, a high-sensitivity Full HD short-wave infrared camera developed for demanding imaging applications.
SenS 1920 SWIR Camera
The system is built around the company’s NSC2101 low-noise focal plane array, designed and manufactured in-house, delivering a 2MP InGaAs sensor with a resolution of 1920 × 1080 pixels and an 8 µm pixel pitch. NIT is the only European company to offer this type of sensor, positioning the SenS 1920 as a distinctive solution for high-resolution SWIR imaging.
Designed for mission-critical applications, the camera combines high sensitivity with a linear response mode. With a typical read-out noise of 25 electrons, it ensures strong image clarity, particularly in low-signal conditions. These characteristics support applications such as intelligence, surveillance, and reconnaissance, as well as precision inspection tasks in semiconductor manufacturing, wafer evaluation, and solar panel analysis.
Integration into existing platforms is enabled through USB 3.0 and CameraLink interfaces, allowing compatibility with a range of imaging systems. The SenS 1920 combines high resolution, superior sensitivity, and robust performance to address requirements across industrial and defense-focused SWIR imaging environments.
At the core of the system, the NSC2101T-SI sensor utilizes InGaAs material and operates across a spectral range of 0.9 to 1.7 µm. It features dual response capability with linear CTIA modes supporting both low and high gain settings. Operational modes include ITR, CDS, and region of interest functionality, with selective line scanning available. The sensor achieves quantum efficiency above 80 percent in low gain and supports frame rates exceeding 60 Hz at full resolution.
The camera maintains a compact form factor, measuring 58 × 58 × 70 mm and weighing under 400 grams. A native C-Mount provides mechanical compatibility, while output options include USB 3.0 and CameraLink. Software support is available through the NITVision graphical interface, along with software development kits for x86-64 and Arm64 platforms, supporting C++, C#, and Python environments.
The SenS 1920 is suited to a range of application scenarios. Its linear high-sensitivity mode enables use as a beam diagnostic tool, while the 1920 × 1080 resolution provides a wider field of view for inspection processes involving semiconductors and solar cells. In defense and security contexts, the Full HD resolution supports improved image detail and sharpness for surveillance and monitoring tasks.
The system supports semiconductor inspection and security and surveillance operations, where image quality and sensitivity are critical. High-resolution SWIR imaging enables enhanced detail capture, supporting long-range observation, environmental monitoring, and infrastructure inspection use cases.
